SCANNING VOL. 36, 1 (2014) © Wiley Periodicals, Inc.
Editorial Special Issue On Diverse Applications of Surface Metrology III This special issue of Scanning contains papers that were presented at the 3rd International Conference on Surface Metrology (ICSM). It was hosted 21–23 March 2012 at the Universite´ de Savoie in Annecy, located in the Haute Savoie region of the French Alps. There is snow in the surrounding mountains in March. From the campus, we looked down on a beautiful lake that bears name of the city. There were over 100 participants and 70 technical presentations, as well as 12 tutorials. The first two ICSMs were held at Worcester Polytechnic Institute in Massachusetts, USA. The fourth will be hosted by Dr. Ellen Schulz and Prof. Thomas Kaiser at the University of Hamburg, Germany, 11–13 March 2014. This collection of papers has a coherence that comes from the conference theme, the measurement and analysis of surfaces across a wide variety of applications. Readers might correctly imagine that, especially in a small conference like this, camaraderie develops among the authors. This special coherency of theme and camaraderie of authors is often not intended, at least to this degree, from scientific and technical publications. The international conference series on surface metrology has been especially valuable because of the special swath it cuts through a multiplicity of disciplines, which otherwise don’t communicate. Our common interests in measuring and analyzing surface topographies within a diverse set of applications provide a rich opportunity for generating new ideas.
Received 16 December 2013; Accepted with revision 16 December 2013 DOI: 10.1002/sca.21135 Published online in Wiley Online Library (wileyonlinelibrary.com).
The value that we get from attending conferences is much more than learning what others are doing. A conference can provide intellectual intimacy for the sharing of ideas among a disparate group with similar concentrations. This can stimulate our thoughts and helps us to see our work from fresh perspectives. The experience gives us insights that we would not have had at home. Each of these papers is a valuable addition to the literature. It is my hope that, as a collection of papers, some of which offer exceptional multi-disciplinary perspectives, this issue of Scanning illuminates the field of Surface Metrology in a way that transcends the relatively narrow confines of each application in each field. The members of the International Surface Metrology community are most grateful to Prof. Serge Samper and his fantastic crew for the excellent job they did in hosting a magnificent conference for the third ICSM. With much depth in so many disciplines, and with such enthusiastic participation, it was the outstanding conference of this young series. We are also grateful for all the work that the authors and reviewers have done to make this special edition possible. Prof. Christopher A. Brown, PhD, FASME Director of WPI’s Surface Metrology Laboratory Worcester, Massachusetts, USA 7 October 2012
Editorial Special Issue On Diverse Applications of Surface Metrology III This special issue of Scanning contains papers that were presented at the 3rd International Conference on Surface Metrology (ICSM). It was hosted 21–23 March 2012 at the Universite´ de Savoie in Annecy, located in the Haute Savoie region of the French Alps. There is snow in the surrounding mountains in March. From the campus, we looked down on a beautiful lake that bears name of the city. There were over 100 participants and 70 technical presentations, as well as 12 tutorials. The first two ICSMs were held at Worcester Polytechnic Institute in Massachusetts, USA. The fourth will be hosted by Dr. Ellen Schulz and Prof. Thomas Kaiser at the University of Hamburg, Germany, 11–13 March 2014. This collection of papers has a coherence that comes from the conference theme, the measurement and analysis of surfaces across a wide variety of applications. Readers might correctly imagine that, especially in a small conference like this, camaraderie develops among the authors. This special coherency of theme and camaraderie of authors is often not intended, at least to this degree, from scientific and technical publications. The international conference series on surface metrology has been especially valuable because of the special swath it cuts through a multiplicity of disciplines, which otherwise don’t communicate. Our common interests in measuring and analyzing surface topographies within a diverse set of applications provide a rich opportunity for generating new ideas.
Received 16 December 2013; Accepted with revision 16 December 2013 DOI: 10.1002/sca.21135 Published online in Wiley Online Library (wileyonlinelibrary.com).
The value that we get from attending conferences is much more than learning what others are doing. A conference can provide intellectual intimacy for the sharing of ideas among a disparate group with similar concentrations. This can stimulate our thoughts and helps us to see our work from fresh perspectives. The experience gives us insights that we would not have had at home. Each of these papers is a valuable addition to the literature. It is my hope that, as a collection of papers, some of which offer exceptional multi-disciplinary perspectives, this issue of Scanning illuminates the field of Surface Metrology in a way that transcends the relatively narrow confines of each application in each field. The members of the International Surface Metrology community are most grateful to Prof. Serge Samper and his fantastic crew for the excellent job they did in hosting a magnificent conference for the third ICSM. With much depth in so many disciplines, and with such enthusiastic participation, it was the outstanding conference of this young series. We are also grateful for all the work that the authors and reviewers have done to make this special edition possible. Prof. Christopher A. Brown, PhD, FASME Director of WPI’s Surface Metrology Laboratory Worcester, Massachusetts, USA 7 October 2012
